![](/img/cover-not-exists.png)
[IEEE 2006 International Conference on Advanced Semiconductor Devices and Microsystems - Smolenice, Slovakia (2006.10.16-2006.10.18)] 2006 International Conference on Advanced Semiconductor Devices and Microsystems - X-ray diffraction characterization of Low Temperature grown GaAs/InP epilayers
Ferrari, C., Dubecky, F., Kudela, R., John, J., Srnanek, R.Year:
2006
Language:
english
DOI:
10.1109/asdam.2006.331174
File:
PDF, 3.37 MB
english, 2006