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[IEEE Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2007.03.18-2007.03.22)] Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Hierarchical Nested Surface Channels for Reduced Particle Stacking and Low-Resistance Thermal Interfaces
Linderman, R. J., Brunschwiler, T., Kloter, U., Toy, H., Michel, B.Year:
2007
Language:
english
DOI:
10.1109/stherm.2007.352392
File:
PDF, 641 KB
english, 2007