[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Stress induced leakage current and bulk oxide trapping: temperature evolution
Ghidini, G., Sebastiani, A., Brazzelli, D.Year:
2002
Language:
english
DOI:
10.1109/relphy.2002.996673
File:
PDF, 144 KB
english, 2002