[IEEE IEEE International Symposium on Power Semiconductor Devices and Integrated Circuits - Cambridge, UK (14-17 April 2003)] ISPSD '03. 2003 IEEE 15th International Symposium on Power Semiconductor Devices and ICs, 2003. Proceedings. - Reliability of CoolMOS/spl trade/ under extremely hard repetitive electrical working conditions
Saint-Eve, F., Lefebvre, S., Khatir, Z.Year:
2003
Language:
english
DOI:
10.1109/ispsd.2003.1225290
File:
PDF, 278 KB
english, 2003