[IEEE 2009 22nd International Conference on VLSI Design: concurrently with the 8th International Conference on Embedded Systems - New Delhi, India (2009.01.5-2009.01.9)] 2009 22nd International Conference on VLSI Design - A 4Gbps 0.57pJ/bit Process-Voltage-Temperature Variation Tolerant All-Digital True Random Number Generator in 45nm CMOS
Srinivasan, Suresh, Mathew, Sanu, Erraguntla, Vasantha, Krishnamurthy, RamYear:
2009
Language:
english
DOI:
10.1109/vlsi.design.2009.69
File:
PDF, 1.04 MB
english, 2009