Direct structural determination in ultrathin ferroelectric...

Physical Review B 2005 / 4 Vol. 71; Iss. 14

Direct structural determination in ultrathin ferroelectric films by analysis of synchrotron x-ray scattering measurements

Fong, D. D., Cionca, C., Yacoby, Y., Stephenson, G. B., Eastman, J. A., Fuoss, P. H., Streiffer, S. K., Thompson, Carol, Clarke, R., Pindak, R., Stern, E. A.
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Volume:
71
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.71.144112
Date:
April, 2005
File:
PDF, 1.54 MB
english, 2005
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