[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Strained silicon MOSFET technology
Hoyt, J.L., Nayfeh, H.M., Eguchi, S., Aberg, I., Xia, G., Drake, T., Fitzgerald, E.A., Antoniadis, D.A.Year:
2002
Language:
english
DOI:
10.1109/iedm.2002.1175770
File:
PDF, 280 KB
english, 2002