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[IEEE 2010 International Symposium on Industrial Embedded Systems (SIES) - Trento, Italy (2010.07.7-2010.07.9)] International Symposium on Industrial Embedded System (SIES) - Context modelling and partial-order reduction: Application to SDL industrial embedded systems
Dumas, Xavier, Boniol, Frederic, Dhaussy, Philippe, Bonnafous, EricYear:
2010
Language:
english
DOI:
10.1109/sies.2010.5551396
File:
PDF, 244 KB
english, 2010