[IEEE 2010 International Symposium on Industrial Embedded...

  • Main
  • [IEEE 2010 International Symposium on...

[IEEE 2010 International Symposium on Industrial Embedded Systems (SIES) - Trento, Italy (2010.07.7-2010.07.9)] International Symposium on Industrial Embedded System (SIES) - Context modelling and partial-order reduction: Application to SDL industrial embedded systems

Dumas, Xavier, Boniol, Frederic, Dhaussy, Philippe, Bonnafous, Eric
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2010
Language:
english
DOI:
10.1109/sies.2010.5551396
File:
PDF, 244 KB
english, 2010
Conversion to is in progress
Conversion to is failed