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[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Monte Carlo simulation of electromigration in polycrystalline metal stripes
Di Pascoli, S., Iannaccone, G.Year:
1999
Language:
english
DOI:
10.1109/ipfa.1999.791304
File:
PDF, 403 KB
english, 1999