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[IEEE 2009 IEEE 3rd International Conference on Biometrics: Theory, Applications, and Systems (BTAS) - Washington, DC, USA (2009.09.28-2009.09.30)] 2009 IEEE 3rd International Conference on Biometrics: Theory, Applications, and Systems - Automatic landmark location with a Combined Active Shape Model
Zhou, Dianle, Petrovska-Delacretaz, Dijana, Dorizzi, BernadetteYear:
2009
Language:
english
DOI:
10.1109/btas.2009.5339037
File:
PDF, 376 KB
english, 2009