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[IEEE 2006 International Conference on Advanced Semiconductor Devices and Microsystems - Smolenice, Slovakia (2006.10.16-2006.10.18)] 2006 International Conference on Advanced Semiconductor Devices and Microsystems - Deep Defects in MOVPE Grown SiC/AlGaN/GaN Heterostructures
Kindl, D., Hubik, P., Kristofik, J., Mares, J. J., Vyborny, Z., Leys, M. R., Boeykens, S.Year:
2006
Language:
english
DOI:
10.1109/asdam.2006.331151
File:
PDF, 3.97 MB
english, 2006