[IEEE 2012 IEEE 23rd International Semiconductor Laser Conference (ISLC) - San Diego, CA, USA (2012.10.7-2012.10.10)] ISLC 2012 International Semiconductor Laser Conference - Multi-spectral investigation of bulk and facet failures in high-power single emitters at 980 nm
Yanson, Dan, Cohen, Shalom, Levy, Moshe, Shamay, Moshe, Geva, Sara, Berk, Yuri, Tesler, Renana, Klumel, Genadi, Rappaport, Noam, Karni, YoramYear:
2012
Language:
english
DOI:
10.1109/islc.2012.6348346
File:
PDF, 719 KB
english, 2012