[IEEE 2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008 - Atlanta, GA, USA (2008.06.15-2008.06.20)] 2008 IEEE MTT-S International Microwave Symposium Digest - An electronically scanned array with 180° scanning range using coupled phase-locked loops
Sheng-Hong Yan,, Tah-Hsiung Chu,Year:
2008
Language:
english
DOI:
10.1109/mwsym.2008.4632928
File:
PDF, 1.04 MB
english, 2008