![](/img/cover-not-exists.png)
[IEEE Tutorial (ICICDT) - Grenoble, France (2008.06.2-2008.06.4)] 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial - Energy-efficient and metastability-immune timing-error detection and recovery circuits for dynamic variation tolerance
Bowman, Keith A., Tschanz, James W., Nam Sung Kim,, Lee, Janice C., Wilkerson, Chris B., Lu, Shih-Lien L., Karnik, Tanay, De, Vivek K.Year:
2008
Language:
english
DOI:
10.1109/icicdt.2008.4567268
File:
PDF, 445 KB
english, 2008