![](/img/cover-not-exists.png)
[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - XWRC: externally-loadedweighted random pattern testing for input test data compression
Seongmoon Wang,, Balakrishnan, K.J., Chakradhar, S.T.Year:
2005
Language:
english
DOI:
10.1109/test.2005.1584018
File:
PDF, 326 KB
english, 2005