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Dielectric Functions of Niobium Doped Bi 3.25 La 0.75 Ti 3 O 12 Thin Films Using Spectroscopic Ellipsometry
Gautam, Prikshit, Sachdeva, Anupama, Singh, Sushil K., Arora, Manoj, Tandon, R. P.Volume:
122
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584587.2010.492293
Date:
November, 2010
File:
PDF, 628 KB
english, 2010