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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - On-chip delay measurement circuit
Jain, Abhishek, Veggetti, Andrea, Crippa, Dennis, Rolandi, PierluigiYear:
2012
Language:
english
DOI:
10.1109/ets.2012.6233014
File:
PDF, 2.26 MB
english, 2012