![](/img/cover-not-exists.png)
Numerical investigation of nanoscale SiGe DG MOSFET performance against the interfacial defects
Bentrcia, Toufik, Djeffal, Fayçal, Dibi, Zouhir, Arar, DjemaiVolume:
12
Language:
english
Journal:
physica status solidi (c)
DOI:
10.1002/pssc.201400088
Date:
January, 2015
File:
PDF, 284 KB
english, 2015