[IEEE 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Opio, France (2008.05.18-2008.05.22)] 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Scaling Properties of Doped Sb2Te Phase Change Line Cells
Jedema, F. J., in 't Zandt, M. A. A., Wolters, R. A. M., Tio Castro, D., Hurkx, G. A. M., Delhougne, R., Gravesteijn, D. J., Attenborough, K.Year:
2008
Language:
english
DOI:
10.1109/nvsmw.2008.18
File:
PDF, 508 KB
english, 2008