![](/img/cover-not-exists.png)
[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - Don't forget to lock your SIB: Hiding instruments using P16871
Dworak, Jennifer, Crouch, Al, Potter, John, Zygmontowicz, Adam, Thornton, MicahYear:
2013
Language:
english
DOI:
10.1109/test.2013.6651903
File:
PDF, 1.47 MB
english, 2013