[IEEE 2010 IEEE International Conference on Imaging Systems...

  • Main
  • [IEEE 2010 IEEE International...

[IEEE 2010 IEEE International Conference on Imaging Systems and Techniques (IST) - Thessaloniki, Greece (2010.07.1-2010.07.2)] 2010 IEEE International Conference on Imaging Systems and Techniques - An imaging system for simultaneous inspection, authentication and forensics

Simske, Steven J., Pollard, Stephen B., Adams, Guy B.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2010
Language:
english
DOI:
10.1109/ist.2010.5548453
File:
PDF, 823 KB
english, 2010
Conversion to is in progress
Conversion to is failed