[IEEE Proceedings Electrical Overstress/Electrostatic Discharge Symposium - Orlando, FL, USA (1997.09.25-1997.09.25)] Proceedings Electrical Overstress/Electrostatic Discharge Symposium - A Study Of Esd Protection Devices For Input Pins Discharge Characteristics Of Diode, Lateral Bipolar Transistor And Thyristor Under Mm And Hbm Tests

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