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[IEEE 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2013.05.28-2013.05.31)] 2013 IEEE 63rd Electronic Components and Technology Conference - Efficient complex broadside coupled trace modeling and estimation of crosstalk impact using statistical BER analysis for high volume, high performance printed circuit board designs
Chada, Arun Reddy, Wu, Songping, Fan, Jun, Drewniak, James L., Mutnury, Bhyrav, de Araujo, Daniel N.Year:
2013
Language:
english
DOI:
10.1109/ectc.2013.6575869
File:
PDF, 1.00 MB
english, 2013