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[IEEE Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - San Jose, CA, USA (March 15-17, 2005)] Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - Design, testing and optimization of a micropump for cryogenic spot cooling applications
Foroughi, P., Benetis, V., Ohadi, M., Yuan Zhao,, Lawler, J.Year:
2005
Language:
english
DOI:
10.1109/stherm.2005.1412201
File:
PDF, 779 KB
english, 2005