[IEEE 2006 IEEE Radiation Effects Data Workshop - Ponte Vedra Beach, FL, USA (2006.07.17-2006.07.21)] 2006 IEEE Radiation Effects Data Workshop - Compendia of Radiation Test Results of Integrated Circuits
Layton, Phil, Gilbert, Charlie, Patnaude, Ed, Williamson, Gale, Longden, Larry, Sloan, ClancyYear:
2006
Language:
english
DOI:
10.1109/redw.2006.295462
File:
PDF, 5.92 MB
english, 2006