Characteristic Relations of Type-III Intermittency in an Electronic Circuit
Kim, Chil-Min, Yim, Geo-Su, Ryu, Jung-Wan, Park, Young-JaiVolume:
80
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/physrevlett.80.5317
Date:
June, 1998
File:
PDF, 444 KB
english, 1998