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[IEEE 2013 21st Iranian Conference on Electrical Engineering (ICEE) - Mashhad, Iran (2013.05.14-2013.05.16)] 2013 21st Iranian Conference on Electrical Engineering (ICEE) - Reliability analysis of logic circuits using binary probabilistic transfer matrix
Zandevakili, Hamed, Mahani, Ali, Saneei, MohsenYear:
2013
Language:
english
DOI:
10.1109/iraniancee.2013.6599691
File:
PDF, 715 KB
english, 2013