![](/img/cover-not-exists.png)
[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Analysis of worst-case hot-carrier conditions for high voltage transistors based on full-band monte-carlo simulations
Starkov, I.A., Tyaginov, S.E., Triebl, O., Cervenka, J., Jungemann, C., Carniello, S., Park, J.M., Enichlmair, H., Karner, M., Kernstock, Ch., Seebacher, E., Minixhofer, R., Ceric, H., Grasser, T.Year:
2010
Language:
english
DOI:
10.1109/ipfa.2010.5532230
File:
PDF, 1.69 MB
english, 2010