[IEEE 2010 17th IEEE International Symposium on the...

  • Main
  • [IEEE 2010 17th IEEE International...

[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Analysis of worst-case hot-carrier conditions for high voltage transistors based on full-band monte-carlo simulations

Starkov, I.A., Tyaginov, S.E., Triebl, O., Cervenka, J., Jungemann, C., Carniello, S., Park, J.M., Enichlmair, H., Karner, M., Kernstock, Ch., Seebacher, E., Minixhofer, R., Ceric, H., Grasser, T.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2010
Language:
english
DOI:
10.1109/ipfa.2010.5532230
File:
PDF, 1.69 MB
english, 2010
Conversion to is in progress
Conversion to is failed