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[IEEE 1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings - Sinaia, Romania (9-12 Oct. 1996)] 1996 International Semiconductor Conference. 19th Edition. CAS'96 Proceedings - Dimorphite based UV detectors
Tsiulyanu, D., Golban, G., Kolomeyko, E., Gumeniuc, N., Melnic, O., Marian, S.Volume:
2
Year:
1996
Language:
english
DOI:
10.1109/smicnd.1996.557455
File:
PDF, 331 KB
english, 1996