[IEEE 2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS) - San Francisco, CA, USA (2014.01.26-2014.01.30)] 2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS) - Fabrication and degradation characteristic of sputtered iridium oxide neural microelectrodes for FES application
Kang, Xiao-Yang, Liu, Jing-Quan, Tian, Hong-Chang, Du, Jing-Cheng, Yang, Bin, Zhu, Hong-Ying, NuLi, Yanna, Yang, Chun-ShengYear:
2014
Language:
english
DOI:
10.1109/memsys.2014.6765716
File:
PDF, 3.14 MB
english, 2014