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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Measurements for the reliability and electrical characterization of semiconductor nanowires
Richter, Curt A., Xiong, Hao D., Xiaoxiao Zhu,, Wenyong Wang,, Stanford, Vincent M., Qiliang Li,, Ioannou, D.E., Woong-Ki Hong,, Takhee Lee,Year:
2008
Language:
english
DOI:
10.1109/relphy.2008.4558860
File:
PDF, 540 KB
english, 2008