[IEEE 20th Biennial Conference on Precision Electromagnetic Measurements - Braunschweig, Germany (17-21 June 1996)] Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements - A low thermal guarded scanner for high resistance measurement systems
Marshall, J.A., Marshall, T.A., Jarrett, D.G., Dziuba, R.F.Year:
1996
Language:
english
DOI:
10.1109/cpem.1996.546536
File:
PDF, 215 KB
english, 1996