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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Total ionizing dose effects on ultra thin buried oxide floating body memories
Mahatme, N. N., Schrimpf, R. D., Reed, R. A., Bhuva, B. L., Griffoni, A., Simoen, E., Aoulaiche, M., Linten, D., Jurczak, M., Groeseneken, G.Year:
2012
Language:
english
DOI:
10.1109/irps.2012.6241920
File:
PDF, 754 KB
english, 2012