A numerical procedure to determine near midgap level defect...

Review of Scientific Instruments 1993 Vol. 64; Iss. 9

A numerical procedure to determine near midgap level defect parameters in Schottky diodes with significant leakage current densities

Dmowski, K., Losson, E., Lepley, B.
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Volume:
64
Year:
1993
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1143886
File:
PDF, 944 KB
english, 1993
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