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[IEEE 2006 16th International Crimean Microwave and Telecommunication Technology - Sevastopol (2006.9.11-2006.9.15)] 2006 16th International Crimean Microwave and Telecommunication Technology - Influence of Initial Silicon Defects on Processes of the Dioxide Silicon Defect Formation
Smyntyna, V., Kulinich, O., Glauberman, M., Chemeresuk, G., Yatsunskiy, I., Sviridova, O.Year:
2006
DOI:
10.1109/crmico.2006.256126
File:
PDF, 2.59 MB
2006