[IEEE ESSDERC 2011 - 41st European Solid State Device Research Conference - Helsinki, Finland (2011.09.12-2011.09.16)] 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations
Nazir, Aftab, Eyben, Pierre, Clarysse, Trudo, Hellings, Geert, Schulze, Andreas, Mody, Jay, De Meyer, Kristin, Vandervorst, WilfriedYear:
2011
Language:
english
DOI:
10.1109/essderc.2011.6044216
File:
PDF, 1.53 MB
english, 2011