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[IEEE 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation (ICST) - Berlin, Germany (2011.03.21-2011.03.25)] 2011 Fourth IEEE International Conference on Software Testing, Verification and Validation - Optimal Test Input Sequence Generation for Finite State Models and Pushdown Systems
Chander, Ajay, Dhurjati, Dinakar, Sen, Koushik, Yu, DachuanYear:
2011
Language:
english
DOI:
10.1109/icst.2011.64
File:
PDF, 435 KB
english, 2011