[IEEE APCCAS 2010-2010 IEEE Asia Pacific Conference on...

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[IEEE APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems - Kuala Lumpur, Malaysia (2010.12.6-2010.12.9)] 2010 IEEE Asia Pacific Conference on Circuits and Systems - Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS device

Salehuddin, F., Ahmad, I., Hamid, F.A., Zaharim, A.
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Year:
2010
Language:
english
DOI:
10.1109/apccas.2010.5774934
File:
PDF, 458 KB
english, 2010
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