![](/img/cover-not-exists.png)
[IEEE APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems - Kuala Lumpur, Malaysia (2010.12.6-2010.12.9)] 2010 IEEE Asia Pacific Conference on Circuits and Systems - Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS device
Salehuddin, F., Ahmad, I., Hamid, F.A., Zaharim, A.Year:
2010
Language:
english
DOI:
10.1109/apccas.2010.5774934
File:
PDF, 458 KB
english, 2010