[IEEE 2008 IEEE Second International Conference on...

  • Main
  • [IEEE 2008 IEEE Second International...

[IEEE 2008 IEEE Second International Conference on Biometrics: Theory, Applications and Systems - Washington, DC, USA (2008.09.29-2008.10.1)] 2008 IEEE Second International Conference on Biometrics: Theory, Applications and Systems - Usability Testing of Face Image Capture for US Ports of Entry

Theofanos, Mary F., Stanton, Brian, Sheppard, Charles, Micheals, Ross
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/btas.2008.4699344
File:
PDF, 4.10 MB
english, 2008
Conversion to is in progress
Conversion to is failed