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[IEEE 2011 34th International Spring Seminar on Electronics Technology (ISSE) - Tratanska Lomnica, Slovakia (2011.05.11-2011.05.15)] Proceedings of the 2011 34th International Spring Seminar on Electronics Technology (ISSE) - Failure analysis of adhesive joining in electronics
Povolotskaya, Evgenia, Mach, PavelYear:
2011
Language:
english
DOI:
10.1109/isse.2011.6053867
File:
PDF, 449 KB
english, 2011