[IEEE 2009 Third ACM/IEEE International Conference on Distributed Smart Cameras (ICDSC) - Como, Italy (2009.08.30-2009.09.2)] 2009 Third ACM/IEEE International Conference on Distributed Smart Cameras (ICDSC) - Metric learning for semi-supervised clustering of Region Covariance Descriptors
Sivalingam, Ravishankar, Morellas, Vassilios, Boley, Daniel, Papanikolopoulos, NikolaosYear:
2009
Language:
english
DOI:
10.1109/icdsc.2009.5289415
File:
PDF, 684 KB
english, 2009