[IEEE 2009 IEEE International Test Conference (ITC) -...

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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC)

Stellari, Franco, Song, Peilin, Sylvestri, John, Miles, Darrell, Forlenza, Orazio, Forlenza, Donato
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Year:
2009
Language:
english
DOI:
10.1109/test.2009.5355543
File:
PDF, 7.22 MB
english, 2009
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