[IEEE 45th ARFTG Conference Digest - Orlando, FL, USA (1995.05.19-1995.05.19)] 45th ARFTG Conference Digest - Up to Date Version of a Computer-Driven Noise Figure Measuring System for the Simultaneous Determination of Noise, Gain and Scattering Parameters of Microwave Transistors
di Paola, A., Mogavero, G., Sannino, M.Year:
1995
Language:
english
DOI:
10.1109/arftg.1995.327113
File:
PDF, 222 KB
english, 1995