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[IEEE Comput. Soc ISQED 2003: 4th International Symposium on Quality Electronic Design - San Jose, CA, USA (24-26 March 2003)] Fourth International Symposium on Quality Electronic Design, 2003. Proceedings. - Leakage current reduction in sequential circuits by modifying the scan chains
Abdollahi, A., Fallah, F., Pedram, M.Year:
2003
Language:
english
DOI:
10.1109/isqed.2003.1194708
File:
PDF, 244 KB
english, 2003