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[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - Improving reliability for bit parallel finite field multipliers using Decimal Hamming
Mavrogiannakis, Nikolaos, Argyrides, Costas, Pradhan, Dhiraj K.Year:
2010
Language:
english
DOI:
10.1109/ewdts.2010.5742055
File:
PDF, 530 KB
english, 2010