[IEEE International Electron Devices Meeting 1998....

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[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - A 2/3" 2-M pixel progressive scan FT-CCD for digital still camera applications

Bosiers, J.T., Kleimann, A.C., van der Sijde, A., Korthout, L., Verbugt, D.W., Peek, H.L., Roks, E., Heringa, A., Vledder, F.F., Opmeer, P.
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Year:
1998
Language:
english
DOI:
10.1109/iedm.1998.746241
File:
PDF, 664 KB
english, 1998
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