[IEEE 2009 20th International Zurich Symposium on Electromagnetic Compatibility - Zurich, Switzerland (2009.01.12-2009.01.16)] 2009 20th International Zurich Symposium on Electromagnetic Compatibility - Setup for Measuring the Derating of SMD Components under ESD Stress
Streibl, Franz, Tenbohlen, Stefan, Hartmann, Jorg, Dudenhoeffer, EricYear:
2009
Language:
english
DOI:
10.1109/emczur.2009.4783411
File:
PDF, 277 KB
english, 2009