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[IEEE [Reliability of Compound Semiconductors] ROCS Workshop 2006 - San Antonio, TX, USA (2006.11.12-2006.11.12)] [Reliability of Compound Semiconductors] ROCS Workshop 2006 - The Effect of Gate Current on the Degradation of GaAs PHEMT MMICs
Chou, Y., Luo, B-w, Leung, D., Kan, Q., Biedenbender, M., Bhorania, R., Lai, R., Eng, D., Farkas, D., Chin, P., Wojtowicz, M., Block, T., Oki, A.Year:
2006
Language:
english
DOI:
10.1109/rocs.2006.323408
File:
PDF, 2.59 MB
english, 2006