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[IEEE 2007 IEEE International Conference on Microelectronic Test Structures - Bunkyo-ku, Japan (2007.03.19-2007.03.22)] 2007 IEEE International Conference on Microelectronic Test Structures - Extraction of Self-Heating Free I-V Curves Including the Substrate Current of PD SOI MOSFETs
Chen, Qiang, Wu, Zhi-Yuan, Su, Richard Y.K., Goo, Jung-Suk, Thuruthiyil, Ciby, Radwin, Martin, Subba, Niraj, Suryagandh, Sushant, Ly, Tran, Wason, Vineet, An, Judy X., Icel, Ali B.Year:
2007
Language:
english
DOI:
10.1109/icmts.2007.374498
File:
PDF, 3.87 MB
english, 2007