[IEEE Fifth International Conference on Solid-State and Integrated Circuit Technology-ICSICT'98 - Beijing, China (21-23 Oct. 1998)] 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105) - Methods for reducing soft errors in deep submicron integrated circuits
Zhang, K., Hareland, S., Senyk, B., Maiz, J.Year:
1998
Language:
english
DOI:
10.1109/icsict.1998.785935
File:
PDF, 211 KB
english, 1998